发明名称 SURFACE INSPECTION DEVICE
摘要 <p>PURPOSE: A surface inspection device is provided to detect a flaw on a specular surface of an object to be inspected with accuracy. CONSTITUTION: A surface inspection device(1) so arranged a light(1a) is irradiated from a point light source or close to a point light source(4), the light is refracted by a Fresnel lens(5) so as to converge in a condition of being close to parallel, the refracted light is reflected by a half mirror(6), the light is irradiated on generally whole area of a specular surface(2) to be inspected and the reflected light is introduced into an image capturing unit(10) provided at a position where the light converges.</p>
申请公布号 KR20010090707(A) 申请公布日期 2001.10.19
申请号 KR20000087142 申请日期 2000.12.30
申请人 CCS INC. 发明人 YONEDA KENJI
分类号 G01N21/95;G01B11/30;G01N21/84;G01N21/88;G11B7/26;H01L21/66;(IPC1-7):G01B11/30 主分类号 G01N21/95
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