发明名称 METALLOGRAPHIC MICROSCOPE USEFUL FOR THE CHARACTERIZATION OF CONDUCTORS DRAWING DIES
摘要 The present invention is related to improvements to a conventional metallographic micro- scope to which changes have been made in the main parts such as the body, plating and lighting system which is integrated by two subsystems, the changes of the main parts are the following: Integration of an electronic circuit for the control, monitoring, selection and ajustment of intensity of light. Changes to the sources of light. Installation of a collimating system for diascopic illumination. Integration of linear scales to the horizontal and vertical axis of the platina. Installation of a positioning device in the platina. Integration of the power supply of the video camera within the body of the microscope. Internal cabling for feeding the camera, supplying signals for synchrony and video output. These changes allow to obtain an ideal characterization of the drawing die s.
申请公布号 CA2085911(C) 申请公布日期 2001.10.16
申请号 CA19922085911 申请日期 1992.12.21
申请人 CENTRO DE INVESTIGACION Y DESARROLLO CONDUMEX, S.A. DE C.V. 发明人 LONGORIA, DANIEL AGUILERA;GARCIA, DANIEL CARDENAS;RUIZ, FERNANDO LUENGAS
分类号 G01B9/04;G02B21/00;G02B21/06;G02B21/36;(IPC1-7):G01B11/08 主分类号 G01B9/04
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