发明名称 INSPECTION SYSTEM FOR MEMORY MODULE SUBSTRATE, SUBSTRATE-MOUNTING DEVICE, MASTER SUBSTRATE FORMING DEVICE, AND RECORDING MEDIUM
摘要 PROBLEM TO BE SOLVED: To provide an inspection system which can be constituted at a low cost and can improve the operation efficiency of substrate inspection of DIMM, etc., by simply performing in a short time the operation to save SPD data saved in a personal computer into an inspection device which can not be connected to the personal computer. SOLUTION: A master substrate 2, having SPD data in a personal computer 1 recorded in an EEPROM, is formed by using a master substrate forming device connected to the personal computer, and the master substrate is mounted in the socket of the inspection device to download the SPD data from the master substrate. The master substrate forming device is provided with a centronics connector 11 for connection with the personal computer, two sockets 13a and 13b where DIMMs can be mounted, and a write control part 14 which writes the SPD data inputted via the centronics connector to the EEPROM on the DIMMs mounted in the sockets. The master substrate can be formed by this simple constitution, so that the inspection system can be constructed easily, without having to obtain expensive inspection devices which are connectable to the personal computer.
申请公布号 JP2001282629(A) 申请公布日期 2001.10.12
申请号 JP20000097514 申请日期 2000.03.31
申请人 RICOH MICROELECTRONICS CO LTD 发明人 MANTANI KOJI
分类号 G06F12/16;G11C29/00;G11C29/56;(IPC1-7):G06F12/16 主分类号 G06F12/16
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