发明名称 |
METHOD OF INSPECTING SHAPE OF SOLDER |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of inspecting the state where a bump of an area-array package is separated from a pattern on a printed board. SOLUTION: In an image obtained by applying an X-ray to a BGA type area-array package mounted on a substrate, cross-sectional areas near the top and middle of a bump are calculated and the ratio of the areas is calculated from the two calculated cross-sectional areas. If the calculated ratio of the areas is larger than a previously set lower limit, soldering is judged to be normal soldering, and if not, soldering is judged to be open soldering.
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申请公布号 |
JP2001284789(A) |
申请公布日期 |
2001.10.12 |
申请号 |
JP20000091180 |
申请日期 |
2000.03.29 |
申请人 |
NAGOYA ELECTRIC WORKS CO LTD |
发明人 |
TERAMOTO TOKUJI;HORIBA ISAO;MURAKOSHI TAKAYUKI |
分类号 |
G01B15/00;G01B15/04;H05K3/34;(IPC1-7):H05K3/34 |
主分类号 |
G01B15/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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