发明名称 METHOD OF INSPECTING SHAPE OF SOLDER
摘要 PROBLEM TO BE SOLVED: To provide a method of inspecting the state where a bump of an area-array package is separated from a pattern on a printed board. SOLUTION: In an image obtained by applying an X-ray to a BGA type area-array package mounted on a substrate, cross-sectional areas near the top and middle of a bump are calculated and the ratio of the areas is calculated from the two calculated cross-sectional areas. If the calculated ratio of the areas is larger than a previously set lower limit, soldering is judged to be normal soldering, and if not, soldering is judged to be open soldering.
申请公布号 JP2001284789(A) 申请公布日期 2001.10.12
申请号 JP20000091180 申请日期 2000.03.29
申请人 NAGOYA ELECTRIC WORKS CO LTD 发明人 TERAMOTO TOKUJI;HORIBA ISAO;MURAKOSHI TAKAYUKI
分类号 G01B15/00;G01B15/04;H05K3/34;(IPC1-7):H05K3/34 主分类号 G01B15/00
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