| 摘要 |
PROBLEM TO BE SOLVED: To reduce the number of connection signals between a main body part and a head part in an IC tester so as to minimize increase of the connection signals even when the number of pins to be measured is increased in a measured device. SOLUTION: In transfer of a pattern data required for an IC test from the main body part 20 to the head part 30, the pattern data are converted into a pulse signal having a predetermined pulse width in a pulse conversion circuit 24 inside the main body part 20, the number of connection signals between the main body part 20 and the head 30 is combined into one line so as to be transferred to the head part 30, and in a pulse inversion circuit 31 inside the head part 30, conversion from the pulse signal into the pattern data is carried out. The pattern data obtained by the pulse inversion circuit 31 are transferred to a pattern data conversion circuit 32.
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