System on chip with ADC having serial test mode

摘要

A system on chip with ADC having serial test mode. An integrated circuit having a processing system with a system clock and a data conversion circuit is provided that is operable to convert data between the analog and the digital domain, the data converter utilizing the system clock during normal operation. A clock isolation circuit is provided for isolating the operation of the data converter from the system clock during a test mode. A serial clock is provided for generating a serial clock during the test mode independent of a system clock. Control circuitry is then operable for controlling the data converter during the test mode to convert data utilizing the serial clock at times not coinciding with the rising and falling edges of the system clock, such control circuit operating in response to receiving a test control signal.