发明名称 DEVICE FOR MANUFACTURING/INSPECTING SEMICONDUCTOR
摘要 <p>PROBLEM TO BE SOLVED: To prevent overheating of a ceramic substrate, by breaking the circuit between a power supply and a resistance electric heater element, even if a fault occurs in a temperature-sensing element and a control device, and the temperature of the ceramic substrate is increased rapidly. SOLUTION: This device for manufacturing/inspecting a semiconductor is composed of a ceramic substrate, that has the resistance electric heater element consisting of one or at least two circuits, a heat-sensing means that measures the temperature of the ceramic substrate, a control part that controls power to be thrown into the resistance electrical heating element, based on the temperature that is detected by the heat-sensing means, a power supply that supplies the power to be thrown into the resistance electrical heater element, and a thermostat that breaks the power to be thrown into the resistance electrical heater element.</p>
申请公布号 JP2001267381(A) 申请公布日期 2001.09.28
申请号 JP20000077560 申请日期 2000.03.21
申请人 IBIDEN CO LTD 发明人 HIRAMATSU YASUJI;ITO YASUTAKA
分类号 H05B3/00;H01L21/205;H01L21/302;H01L21/3065;H01L21/66;H01L21/68;H01L21/683;(IPC1-7):H01L21/66;H01L21/306 主分类号 H05B3/00
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