发明名称 METHOD OF MANUFACTURING LOW-TEMPERATURE POLYSILICON TFT DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing low-temperature polysilicon TFT devices which are formed on the same substrate and kept high in uniformity. SOLUTION: An a-Si film 20a is formed on a substrate and irradiated with a first laser beam L1 at a regular interval, by which polycrystalline parts 20b are formed at a regular interval in the a-Si film 20a. Thereafter, nearly all the surface of the a-Si film 20a is irradiated with a second laser beam L2, by which nearly all the a-Si film 20a is turned polycrystalline for the formation of a polysilicon film 21.
申请公布号 JP2001267240(A) 申请公布日期 2001.09.28
申请号 JP20000079816 申请日期 2000.03.22
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 ISHIKAWA KATSUYA
分类号 H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L21/20 主分类号 H01L21/20
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