发明名称 APPARATUS FOR MEASURING REFLECTING CHARACTERISTICS
摘要 PROBLEM TO BE SOLVED: To rapidly and accurately measure reflecting characteristics without contact by incorporating a scanning mechanism. SOLUTION: A CPU 65 obtains a correction coefficient for representing a relation between a distance between a spectrocolorimeter and a sample to be measured and colorimetric data at a plurality of scanning positions, and stores the obtained correction coefficients in an EEPROM 67. When a measuring switch of an operation display unit 12 is pressed, the CPU 65 controls operations of X-axis and Y-axis pulse motors 6, 10 via an input/output IC 70 to move the spectrocolorimeter, controls a light emitting circuit 66 to emit a light from a light source 21 at the respective measuring positions to conduct a colorimetric operation, and obtains colorimetric values of a sample to be measured by using a white calibration value and a zero calibration value stored in the EEPROM 67. The CPU 65 corrects the obtained colorimetric value by using interpolating data obtained by interpolating the correction coefficient from the relation between the scanning position for obtaining the coefficient sand the measuring position stored in the EEPROM 67.
申请公布号 JP2001264173(A) 申请公布日期 2001.09.26
申请号 JP20000070638 申请日期 2000.03.14
申请人 MINOLTA CO LTD 发明人 FUKUCHI SHINSUKE;MIYASHITA TOSHIO;HIRATA TAKESHI;ISHIKAWA NORIO
分类号 G01J3/46;G01N21/27;(IPC1-7):G01J3/46 主分类号 G01J3/46
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