| 摘要 |
<p>A monitored burn-in test system and a monitored burn-in test method of microcomputers, which are capable of implementing the monitored burn-in test without increasing a load of software and improving the function of a tester unit. When microcomputers supply a tester unit with measurement data stored in a data compressing circuit comprised of a linear feedback resister, test data outputted by all of the microcomputers can be read synchronously into the tester unit by shifting out the measurement data synchronously with a monitoring clock signal outputted by the tester unit. Thus, it is made possible to monitor the test results of all microcomputers at the same time in the tester unit. Therefore, it can be avoided that a load of software gets heavier since the monitoring of the test results is certainly executed by the tester unit. <IMAGE></p> |
