发明名称 |
MAGNETIC FIELD MEASURING METHOD AND MAGNETIC FIELD MEASURING APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To provide a measuring method capable of precisely measuring a wide-ranging low magnetic field absolute strength, and a measuring apparatus capable of performing the method by using a single probe. SOLUTION: This magnetic field measuring method includes a process that detects a change in a magnetic flux parallel to the static magnetic field generated by magnetic resonance. This magnetic field measuring apparatus is provided with at least a paramagnetic species, a means that irradiates the paramagnetic species with an electromagnetic wave, and a detection means that detects the change of the magnetic flux directed in parallel to the static magnetic field.
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申请公布号 |
JP2001264401(A) |
申请公布日期 |
2001.09.26 |
申请号 |
JP20000081111 |
申请日期 |
2000.03.23 |
申请人 |
YAMAGATA PUBLIC CORP FOR THE DEVELOPMENT OF INDUSTRY;YAMAGATA PREFECTURE |
发明人 |
YOKOYAMA HIDEKATSU;SATO TOSHIYUKI |
分类号 |
G01R33/20;A61B5/055;G01R33/389;G01R33/60;(IPC1-7):G01R33/20 |
主分类号 |
G01R33/20 |
代理机构 |
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主权项 |
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地址 |
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