发明名称 THICKNESS MEASURING INSTRUMENT USING RADIATION
摘要 PROBLEM TO BE SOLVED: To stably and accurately provide a radiation thickness measuring instrument for measuring the thickness of an object to be measured by minimizing the effects of vibration of a rolling line. SOLUTION: A radiation generation part 1, for irradiating the object 4 to be measured flowing along the rolling line, is arranged to either of the upper and lower frame parts of a frame 3 or a radiation detection part 2 for detecting the quantity of radiation transmitted through the object to be measured is arranged to the other and the frame 3 has a damping device 5 resonated, with respect to the vibration of the rolling line to prevent the vibration thereof. The damping device 5 has a mass point 6 which moves along the upper or lower frame part to change the natural frequency of the frame and a moving mechanism 7 for moving the mass point.
申请公布号 JP2001255131(A) 申请公布日期 2001.09.21
申请号 JP20000064035 申请日期 2000.03.08
申请人 TOSHIBA FA SYST ENG CORP;TOSHIBA CORP 发明人 ISHIZUKA TERUO;TAKAGI TSUGITO;SANO KISHIO
分类号 G01B15/02;(IPC1-7):G01B15/02 主分类号 G01B15/02
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