发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for manufacturing a reliable semiconductor device which has a resin layer and can prevent a defect such as a disconnection in a connected part caused by a thermal stress. SOLUTION: The semiconductor device is manufactured by printing resin having an elastic modulus of 0.2-3.0 Gpa, a glass transition temperature of 180 deg.C or more and a 5%-weight reducing temperature of 300 deg.C or more on a semiconductor wafer to form a plurality of resin layers ; forming a second wiring layer for electric conduction with an electrode of the wafer on the resin layer; printing the resin on the second wiring layer to form a plurality of protective layers for the second wiring layer; making a through-hole arriving at the second wiring layer in the protective layer of the second wiring layer; forming an external electrode terminal in the through-hole; and cutting the wafer into individual semiconductor devices.
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申请公布号 |
JP2001257282(A) |
申请公布日期 |
2001.09.21 |
申请号 |
JP20000071025 |
申请日期 |
2000.03.09 |
申请人 |
HITACHI CHEM CO LTD |
发明人 |
TANAKA TOSHIAKI;YASUDA MASAAKI;MORISHITA YOSHII;NISHIZAWA HIROSHI;YANO YASUHIRO;KANEDA AIZO |
分类号 |
H01L23/12;(IPC1-7):H01L23/12 |
主分类号 |
H01L23/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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