| 摘要 |
PROBLEM TO BE SOLVED: To prevent deterioration of a large-signal nonlinear circuit analysis accuracy of a high frequency circuit when a model parameter is determined so that an experimental expression coincides with the I-V characteristic of a DC. SOLUTION: On the basis of S parameter measurement by a high frequency network analyzer 16, a measurement characteristic calculator 6 finds a mutual conductance 'gm' and output conductance 'go' of a semiconductor device, integrates these conductances to generate a measurement I-V characteristic. The calculator also computes differentiated values of the conductances. A model characteristic calculator 8 generates an I-V characteristic based on model parameters, differentiates the I-V characteristic to find each conductance and a differentiated value thereof. A comparison calculator 10 judges whether or not the I-V characteristic, 'gm', 'go' and differentiated values thereof based on measured values obtained by the measurement characteristic calculator 6 coincide with corresponding characteristic values calculated by the model characteristic calculator 8. A model parameter generator 12 performs parameter fitting so that these values coincide with the characteristic values.
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