| 摘要 |
PROBLEM TO BE SOLVED: To allow an engineer who does not have any special knowledge about test program language to easily prepare a desired test program. SOLUTION: This test program developing device 110 is provided with a means 111 for setting the generation condition of a test program, and for generating the test information of a test item, a means 112 for reading and storing the test information and IC design data in a storage area, a test condition data base including the test condition of the test item, a means 113 for selecting the test condition corresponding to the test item form the test condition data base by comparing the test information of the test item with the data of the test condition data base, a means 113 for displaying and editing the read test information at a display part, and a means 114 for compositing test programs based on the IC design data, the selected test condition, and the edited test information. |
