发明名称 Method for making an integrated circuit including deutrium annealing of metal interconnect layers
摘要 A method of making an integrated circuit includes forming a plurality of copper interconnect layers adjacent a semiconductor substrate. The plurality of copper interconnect layers are then annealed, in a deuterium ambient, prior to chemical mechanical polishing of such layers. The microstructure of each of the copper interconnect layers is thereby stabilized.
申请公布号 US6281110(B1) 申请公布日期 2001.08.28
申请号 US19990361733 申请日期 1999.07.27
申请人 LUCENT TECHNOLOGIES INC. 发明人 KIZILYALLI ISIK C.;MERCHANT SAILESH MANSINH;ROY PRADIP KUMAR
分类号 H01L21/321;H01L21/768;(IPC1-7):H01L21/476;H01L21/44 主分类号 H01L21/321
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