发明名称 WAFER CUTTING EQUIPMENT AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide wafer cutting equipment equipped with two spindles and a method wherein the equipment can be improved in cutting efficiency, throughput, and cutting quality by specifying the best directions of rotation of the two spindles. SOLUTION: This dicing equipment 10 cuts out a wafer W by two spindles 34 and 36 which are arranged in face to face with each other and rotating each in opposite directions. When the two spindles 34 and 36 are rotated in the same direction, both a down-cutting and an up-cutting operation can be carried out at the same time. On the other hand, when the spindles 34 and 36 are arranged in parallel and rotated in reverse directions to cut out a wafer W, both a down-cutting and an up-cutting operation can be carried out at the same time.
申请公布号 JP2001230221(A) 申请公布日期 2001.08.24
申请号 JP20000040981 申请日期 2000.02.18
申请人 TOKYO SEIMITSU CO LTD 发明人 AZUMA MASAYUKI;ADACHI TEI
分类号 H01L21/301;(IPC1-7):H01L21/301 主分类号 H01L21/301
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