| 摘要 |
PROBLEM TO BE SOLVED: To make testable a short circuit of a connecting end in a semiconductor electronic device by means of a simple and sure method even when the connecting end in the semiconductor electronic device fixed on a conductor board is covered. SOLUTION: In this testing method for testing a short circuit in the connecting end 2 of the semiconductor electronic device arranged inside a housing 1 and fixed on the conductor board, the level of each connecting end 2 is set to a level different from that of the adjacent connecting end at least once, and current inflow of the semiconductor electronic device is monitored while the respective connecting ends are set.
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