发明名称 ABRASIVE GRAIN AND POLISHING LIQUID, METHOD OF POLISHING THEREOF, AND METHOD OF PRODUCING SEMICONDUCTOR APPARATUS
摘要 <p>PROBLEM TO BE SOLVED: To reduce scratches occurring in polishing of a thin film since flattening of the thin film formed on a wafer is indispensable so as to attain a high integration of semiconductor element. SOLUTION: The surface of a material to be polished is chemically and mechanically flattened by using a polishing solution obtained by dispersing complex particles composed of an inorganic substance and a nonelectrolytic organic substance having >=500 molecular weight as abrasive grains into a solvent and adding a polishing promoter to the dispersion.</p>
申请公布号 JP2001226666(A) 申请公布日期 2001.08.21
申请号 JP20000041366 申请日期 2000.02.15
申请人 HITACHI LTD 发明人 KATSUMURA NOBUHITO
分类号 B24B57/02;B24B37/00;B24D3/00;C09K3/14;C09K13/00;H01L21/304;H01L21/306;(IPC1-7):C09K3/14 主分类号 B24B57/02
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