发明名称 |
ABRASIVE GRAIN AND POLISHING LIQUID, METHOD OF POLISHING THEREOF, AND METHOD OF PRODUCING SEMICONDUCTOR APPARATUS |
摘要 |
<p>PROBLEM TO BE SOLVED: To reduce scratches occurring in polishing of a thin film since flattening of the thin film formed on a wafer is indispensable so as to attain a high integration of semiconductor element. SOLUTION: The surface of a material to be polished is chemically and mechanically flattened by using a polishing solution obtained by dispersing complex particles composed of an inorganic substance and a nonelectrolytic organic substance having >=500 molecular weight as abrasive grains into a solvent and adding a polishing promoter to the dispersion.</p> |
申请公布号 |
JP2001226666(A) |
申请公布日期 |
2001.08.21 |
申请号 |
JP20000041366 |
申请日期 |
2000.02.15 |
申请人 |
HITACHI LTD |
发明人 |
KATSUMURA NOBUHITO |
分类号 |
B24B57/02;B24B37/00;B24D3/00;C09K3/14;C09K13/00;H01L21/304;H01L21/306;(IPC1-7):C09K3/14 |
主分类号 |
B24B57/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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