TESTING METHOD OF AND TESTING DEVICE FOR SEMICONDUCTOR CIRCUIT

摘要

PURPOSE: To obtain a method and device for testing a semiconductor circuit which can execute a test considering test conditions for quaranteeing normal functioning of a test object circuit after self-recovery and improves the reliability of the test results. CONSTITUTION: A logic test identical to the logic test by initial test conditions is conducted with test conditions varied from the initial test conditions to a test object circuit capable of recovering of failure positions. Failure information obtained as the results of the logic test by the initial conditions is compared with failure information obtained as the results of the logic test by the varied test conditions to confirm normal functioning of the test object circuit in the initial test conditions and the varied test conditions.