发明名称 CHARGE BEAM DRAWING DEVICE AND CHARGE BEAM DRAWING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide a charge beam drawing device and method therefor which reduce the standby time for maintaining the temperature of a glass substrate 1 at the same temperature as the temperature in a sample chamber 5. SOLUTION: The charge beam drawing device 50 consists of a cassette stocker 2 in which plural glass substrates 1 are housed in a direction where the glass substrates are transported, a spare chamber 12 which internally has a temperature control means 14, an evacuatable load locking chamber 3, a robot chamber 4 which is internally evacuated to a vacuum during the operation of the device and a sample chamber 5 which is internally evacuate to vacuum during the operation of the device and where the glass substrates 1 are subjected to drawing. The sample chamber 5 is internally provided with a stage 10 which may be loaded with the glass substrates 1. The upper part of the sample chamber 5 is provided with an electron gun for emitting an electron beam and a lens barrel 11 having various kinds of apertures, lenses, deflectors, etc., for forming the electron beam to a pattern shape. The temperature of the glass substrates 1 may be rapidly maintained at the same temperature as the temperature in the sample chamber 5 by such constitution of the spare chamber 12.</p>
申请公布号 JP2001222099(A) 申请公布日期 2001.08.17
申请号 JP20000033268 申请日期 2000.02.10
申请人 TOSHIBA CORP 发明人 OGASAWARA MUNEHIRO;SUNAOSHI HITOSHI;HATTORI SEIJI;AKENO MASANOBU;TAKAMATSU JUN;SHIMOMURA NAOHARU
分类号 H01J37/20;G03F1/76;G03F1/78;H01J37/305;H01L21/027;(IPC1-7):G03F1/08 主分类号 H01J37/20
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