INTEGRATED CIRCUIT DEVICE, AND METHOD AND DEVICE FOR INSPECTING INTEGRATED CIRCUIT

摘要

PROBLEM TO BE SOLVED: To inspect the signal of an internal digital circuit part in an integrated circuit device for processing a digital signal at a low cost. SOLUTION: This integrated circuit device comprises a D/A converter 7 in addition to the constitution of a conventional integrated circuit device. In this device, a digital signal to be inspected is converted to an analog signal and outputted to an inspection device, and the analog signal is further returned to the digital signal by an A/D converter 14 in its input to the inspection device.