发明名称 |
SILICON ON INSULATOR CIRCUIT STRUCTURE WITH BURIED SEMICONDUCTOR INTERCONNECT STRUCTURE AND METHOD FOR FORMING SAME |
摘要 |
A silicon on insulator (SOI) substrate is formed with a base substrate, a buried oxide layer over the base substrate, and a thin silicon device layer over the buried oxide layer. A buried semiconductor interconnect structure is embedded in the buried oxide layer for providing high resistance semiconductor coupling between various devices fabricated in the silicon device layer. A method for forming an SOI substrate with a buried semiconductor interconnect structure includes forming the structure as a protrusion on the face of a first substrate and filling the non-protruding regions with an insulator to create a smooth face. The substrate is fused face down on a second substrate to form the silicon on insulator substrate. |
申请公布号 |
WO0154174(A1) |
申请公布日期 |
2001.07.26 |
申请号 |
WO2000US34212 |
申请日期 |
2000.12.13 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
BUYNOSKI, MATTHEW, S. |
分类号 |
H01L21/20;H01L21/762;H01L21/84;H01L27/12;H01L29/06 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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