发明名称 SILICON ON INSULATOR CIRCUIT STRUCTURE WITH BURIED SEMICONDUCTOR INTERCONNECT STRUCTURE AND METHOD FOR FORMING SAME
摘要 A silicon on insulator (SOI) substrate is formed with a base substrate, a buried oxide layer over the base substrate, and a thin silicon device layer over the buried oxide layer. A buried semiconductor interconnect structure is embedded in the buried oxide layer for providing high resistance semiconductor coupling between various devices fabricated in the silicon device layer. A method for forming an SOI substrate with a buried semiconductor interconnect structure includes forming the structure as a protrusion on the face of a first substrate and filling the non-protruding regions with an insulator to create a smooth face. The substrate is fused face down on a second substrate to form the silicon on insulator substrate.
申请公布号 WO0154174(A1) 申请公布日期 2001.07.26
申请号 WO2000US34212 申请日期 2000.12.13
申请人 ADVANCED MICRO DEVICES, INC. 发明人 BUYNOSKI, MATTHEW, S.
分类号 H01L21/20;H01L21/762;H01L21/84;H01L27/12;H01L29/06 主分类号 H01L21/20
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