发明名称 |
CONTACT STRUCTURE OF INTERCONNECTION, MANUFACTURING METHOD THEREOF, THIN FILM TRANSISTOR SUBSTRATE INCLUDING THE SAME AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A method for manufacturing a contact structure of an interconnection is provided to minimize contact resistance of a contact part composed of aluminum-based metal and an indium-zinc-oxide(IZO) material and to guarantee reliability of the contact part including a pad part, by performing a heat treatment process and eliminating a residual material on a metal layer. CONSTITUTION: A metal interconnection is formed on a substrate. An inorganic insulation layer covering the interconnection is deposited. A heat treatment process is performed. The inorganic insulation layer is patterned to form a contact hole(74,76,78) exposing the interconnection. A conductive layer electrically connected to the interconnection is formed.
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申请公布号 |
KR20010070111(A) |
申请公布日期 |
2001.07.25 |
申请号 |
KR20000057037 |
申请日期 |
2000.09.28 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
YOO, CHUN GI |
分类号 |
H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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