发明名称 CONTACT STRUCTURE OF INTERCONNECTION, MANUFACTURING METHOD THEREOF, THIN FILM TRANSISTOR SUBSTRATE INCLUDING THE SAME AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A method for manufacturing a contact structure of an interconnection is provided to minimize contact resistance of a contact part composed of aluminum-based metal and an indium-zinc-oxide(IZO) material and to guarantee reliability of the contact part including a pad part, by performing a heat treatment process and eliminating a residual material on a metal layer. CONSTITUTION: A metal interconnection is formed on a substrate. An inorganic insulation layer covering the interconnection is deposited. A heat treatment process is performed. The inorganic insulation layer is patterned to form a contact hole(74,76,78) exposing the interconnection. A conductive layer electrically connected to the interconnection is formed.
申请公布号 KR20010070111(A) 申请公布日期 2001.07.25
申请号 KR20000057037 申请日期 2000.09.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YOO, CHUN GI
分类号 H01L29/786;(IPC1-7):H01L29/786 主分类号 H01L29/786
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