发明名称 CAPACITOR DEVICE, MANUFACTURING METHOD THEREOF, AND SEMICONDUCTOR DEVICE
摘要 PURPOSE: A capacitor device, a manufacturing method thereof, and a semiconductor device are provided to be capable of forming a dielectric layer under oxygen gas atmosphere without the deterioration of capacitor device characteristics. CONSTITUTION: A capacitor device is provided with a lower substrate(30), an insulating layer(32) having a connection hole(34) on the lower substrate, the first diffusion barrier(36) formed on the entire surface of the resultant structure, and a lower electrode(38) formed on the first diffusion barrier for being electrically connected with the lower substrate through the connection hole. The capacitor device further includes the second diffusion barrier(40) formed on the predetermined portion of the lower electrode, a dielectric layer(42) formed on the resultant structure, and an upper electrode(44) on the dielectric layer.
申请公布号 KR100304797(B1) 申请公布日期 2001.07.24
申请号 KR20000083543 申请日期 2000.12.28
申请人 FUJITSU LIMITED 发明人 NAKABAYASHI MASAAKI;TAMURA TETSURO;NOSHIRO HIDEYUKI
分类号 H01L27/108;C23C14/06;C23C16/04;C23C16/18;C23C16/40;H01L21/02;H01L21/285;H01L21/768;H01L21/8242;(IPC1-7):H01L27/108 主分类号 H01L27/108
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