发明名称 INTERCONNECTION STRUCTURE WITH INSULATION COMPRISING CAVITIES
摘要 The invention concerns a method for making a Damascene type interconnection structure on a semiconductor device, comprising the following steps: forming a first level of conductors in a first layer on electrical insulation and a second level of conductors in a second layer of electrical insulation, the first level conductors being spaced apart to enable, in a subsequent step, the formation of cavities between the first level conductors; eliminating the second electrical insulation level; eliminating at least partially the first electrical insulation layer to eliminate the parts of the first layer corresponding to the cavities to be formed; depositing on the resulting structure a material with low permittivity, said deposit not filling up the space between the first level conductors which have been arranged spaced apart to enable the formation of cavities.
申请公布号 WO0150524(A1) 申请公布日期 2001.07.12
申请号 WO2000FR03713 申请日期 2000.12.28
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE;STMICROELECTRONICS SA;DEMOLLIENS, OLIVIER;BERRUYER, PASCALE;TROUILLER, YORICK;MORAND, YVES 发明人 DEMOLLIENS, OLIVIER;BERRUYER, PASCALE;TROUILLER, YORICK;MORAND, YVES
分类号 H01L21/768;(IPC1-7):H01L21/768 主分类号 H01L21/768
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