发明名称 |
METHOD FOR MANUFACTURING DUAL GATE ELECTRODE |
摘要 |
PURPOSE: A method for fabricating a dual gate electrode is to reduce a mask process by implanting an impurity ion into a gate electrode formed by a polysilicon layer or an amorphous silicon layer. CONSTITUTION: An isolation insulating layer(13) is formed in a semiconductor substrate(10). A p-well(11) and an n-well(12) are formed at the semiconductor substrate. A gate insulating layer is grown on the entire surface of the semiconductor substrate. A polysilicon layer is formed on the gate insulating layer. A gate electrode is formed by etching the polysilicon layer, using a gate electrode mask as an etching mask. An n-LDD(lightly doped drain) region is formed by implanting an n-impurity ion having a low concentration into the entire surface of the semiconductor substrate. A p-LDD region is formed by implanting a p-impurity ion having a low concentration into the entire surface of the semiconductor substrate. An insulating layer spacer is formed on the sidewall of the gate electrode. An n+ gate electrode and an n+ source/drain region(18a) are formed by implanting an n+ impurity ion having a high concentration on both sides of the insulating layer spacer and the gate electrode.
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申请公布号 |
KR20010066327(A) |
申请公布日期 |
2001.07.11 |
申请号 |
KR19990067927 |
申请日期 |
1999.12.31 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHOI, JUN GI;KIM, DONG CHAN |
分类号 |
H01L21/336;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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