发明名称 |
SEMICONDUCTOR WAFER AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PURPOSE: A semiconductor wafer and a method for manufacturing the same are provided to prevent a damage of a dummy region by forming a moat pattern on an active region and the dummy region of a semiconductor substrate. CONSTITUTION: A moat pattern is formed on an active region and a dummy region of a semiconductor substrate(100) by using an STI(Shallow Trench Isolation) method. The moat pattern is used as an isolation pattern for isolating devices. The moat pattern is formed with an insulating material such as TEOS(TetraEthOxySilane). A gate insulating layer(400) is formed on the semiconductor substrate(100). A gate electrode(510) is formed on the gate insulating layer(400).
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申请公布号 |
KR20010066151(A) |
申请公布日期 |
2001.07.11 |
申请号 |
KR19990067736 |
申请日期 |
1999.12.31 |
申请人 |
ANAM SEMICONDUCTOR., LTD. |
发明人 |
KO, GWAN JU |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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