发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide the manufacturing method of a thin-film transistor having superior productivity. SOLUTION: In this thin-film transistor, an underlying film, a gate insulating film and an interlayer insulating film are formed of a silicon oxide film. Then, the silicon oxide film is formed by a CVD method, using TEOS and oxygen.
申请公布号 JP2001189462(A) 申请公布日期 2001.07.10
申请号 JP20000322035 申请日期 2000.10.20
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI
分类号 C23C16/24;H01L21/20;H01L21/316;H01L21/336;H01L29/786;(IPC1-7):H01L29/786 主分类号 C23C16/24
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