发明名称 METHOD FOR MANUFACTURING MOS TRANSISTOR OF ELEVATED SOURCE/DRAIN STRUCTURE
摘要 PURPOSE: A method for manufacturing a MOS transistor of an elevated source/drain structure is provided to prevent degradation of a device due to a short-channel effect by forming a MOS transistor of an elevated source/drain structure with a shallow junction. CONSTITUTION: A gate structure including a mask insulating layer(34) and a gate sidewall spacer(35) is formed on a silicon substrate(30). The first selective epitaxial silicon layer(36) is grown on the silicon substrate(30). The second selective epitaxial silicon layer(37) is grown on the first selective epitaxial silicon layer(36). A boron-counter doping process is performed on the second selective epitaxial silicon layer(37). The dopant formed on the second selective epitaxial layer(37) is diffused by performing a thermal process.
申请公布号 KR20010064122(A) 申请公布日期 2001.07.09
申请号 KR19990062255 申请日期 1999.12.24
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, JEONG HO
分类号 H01L21/336;(IPC1-7):H01L21/336 主分类号 H01L21/336
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