发明名称 |
METHOD FOR MANUFACTURING MOS TRANSISTOR OF ELEVATED SOURCE/DRAIN STRUCTURE |
摘要 |
PURPOSE: A method for manufacturing a MOS transistor of an elevated source/drain structure is provided to prevent degradation of a device due to a short-channel effect by forming a MOS transistor of an elevated source/drain structure with a shallow junction. CONSTITUTION: A gate structure including a mask insulating layer(34) and a gate sidewall spacer(35) is formed on a silicon substrate(30). The first selective epitaxial silicon layer(36) is grown on the silicon substrate(30). The second selective epitaxial silicon layer(37) is grown on the first selective epitaxial silicon layer(36). A boron-counter doping process is performed on the second selective epitaxial silicon layer(37). The dopant formed on the second selective epitaxial layer(37) is diffused by performing a thermal process.
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申请公布号 |
KR20010064122(A) |
申请公布日期 |
2001.07.09 |
申请号 |
KR19990062255 |
申请日期 |
1999.12.24 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, JEONG HO |
分类号 |
H01L21/336;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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