发明名称 SEMICONDUCTOR STORAGE DEVICE, AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: To provide a semiconductor storage device which has a floating gate and a control gate and whose source and drain regions are asymmetrical and which can avoid the increase of the resistance of a bit line arranged between the floating gates in itself and besides can scale down the bit line width. CONSTITUTION: This is a manufacturing method for a semiconductor storage device consisting of forming a floating gate 3 through an insulating film 2 on a semiconductor substrate 1, and forming a sidewall spacer 8 by an insulating film at the side wall of that floating gate, digging down the semiconductor substrate to form a groove 9 using that side wall as a mask, then, forming a lightly doped layer 10 from one sidewall of the groove to the bottom by oblique ion implantation to the obtained semiconductor substrate, and also, forming a heavily doped layer 11 from the other sidewall of the groove to the bottom by reversely oblique ion implantation.
申请公布号 KR20010062172(A) 申请公布日期 2001.07.07
申请号 KR20000073810 申请日期 2000.12.06
申请人 FUJIO MASUOKA;SHARP CORPORATION 发明人 FUJIO MASUOKA;SHIMIZU HIROAKI;TANAKA KENICHI;TANIGAMI TAKUJI;WADA YOSHIHISA
分类号 G11C16/04;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 G11C16/04
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