发明名称 |
SEMICONDUCTOR STORAGE DEVICE, AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: To provide a semiconductor storage device which has a floating gate and a control gate and whose source and drain regions are asymmetrical and which can avoid the increase of the resistance of a bit line arranged between the floating gates in itself and besides can scale down the bit line width. CONSTITUTION: This is a manufacturing method for a semiconductor storage device consisting of forming a floating gate 3 through an insulating film 2 on a semiconductor substrate 1, and forming a sidewall spacer 8 by an insulating film at the side wall of that floating gate, digging down the semiconductor substrate to form a groove 9 using that side wall as a mask, then, forming a lightly doped layer 10 from one sidewall of the groove to the bottom by oblique ion implantation to the obtained semiconductor substrate, and also, forming a heavily doped layer 11 from the other sidewall of the groove to the bottom by reversely oblique ion implantation.
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申请公布号 |
KR20010062172(A) |
申请公布日期 |
2001.07.07 |
申请号 |
KR20000073810 |
申请日期 |
2000.12.06 |
申请人 |
FUJIO MASUOKA;SHARP CORPORATION |
发明人 |
FUJIO MASUOKA;SHIMIZU HIROAKI;TANAKA KENICHI;TANIGAMI TAKUJI;WADA YOSHIHISA |
分类号 |
G11C16/04;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 |
主分类号 |
G11C16/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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