发明名称 MODULE HANDLER AND TESTING METHOD THEREOF
摘要 PURPOSE: A module handler and a testing method thereof are provided to improved the reliability of the product by improving the reliability of the module test and reduce the manufacturing cost by enabling the mass manufacturing of the tester computer even though the tester computer has the same configuration as with the user's PC environment. CONSTITUTION: The module handler includes a module supplying unit(100), a module testing unit(200), a module retracting unit(300) and a pick-and-place unit(400). The module supplying unit(100), supplying the module before the module test, includes a retracting tray loader(110), an unloader(120), a tray fixing element and a tray shifter(140). The module testing unit(200), testing the module of the user's computer with a test computer having the same configuration as with the user's computer, includes multiple motherboards(210), a re-test buffer(230) and a fault tray(240). The module retracting unit(300), loading the tested module onto a user tray, has a similar to the configuration of the module supplying unit(100), but has a variable structure as the size of the user tray varies to the module. The module retracting unit(300) includes a loader(310), an unloader(320), a user tray fixing jig and a tray shifter. The pick-and-place unit(400), moving the module among the module supplying unit(100), the module testing unit(200) and the module retracting unit(300). includes a header(410) and a moving robot.
申请公布号 KR20010060499(A) 申请公布日期 2001.07.07
申请号 KR19990062894 申请日期 1999.12.27
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, JUN HO
分类号 G01R31/26;H01L21/66;(IPC1-7):G01R31/26 主分类号 G01R31/26
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