发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device is provided to optimize a characteristic of a transistor by performing an ion implantation process using an ion energy. CONSTITUTION: An N channel transistor is formed on a cell transistor formation region and a peripheral region of a semiconductor substrate(11). A gate electrode is formed on a buried P-channel transistor formation region. The first n-LDD region(23) is formed by implanting n-dopant ions on the whole surface. A pad oxide layer is formed on the whole structure. A photoresist pattern(27) is formed on an upper portion of the pad oxide layer. The second n-LDD region(28) is formed by implanting n-dopant ions on the first n-LDD region(23). The photoresist pattern(27) is removed. A pad nitride layer is formed on the whole structure.
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申请公布号 |
KR20010059985(A) |
申请公布日期 |
2001.07.06 |
申请号 |
KR19990067981 |
申请日期 |
1999.12.31 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KOO, BON SEONG;LEE, JEONG HUN |
分类号 |
H01L27/085;(IPC1-7):H01L27/085 |
主分类号 |
H01L27/085 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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