发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICES |
摘要 |
PURPOSE: A method for manufacturing semiconductor devices is provided to be capable of increasing the uniformity of doping in a polysilicon film for a gate and also maintaining a shallow junction. CONSTITUTION: A method for manufacturing semiconductor devices prepares a semiconductor substrate(1) having device isolation films(2) defining a device formation region. A gate oxide film(3) and a conductive film for a gate are sequentially formed on the semiconductor substrate. The conductive film for gate and gate oxide film are patterned to be a gate electrode shape. A N type low concentration impurity region is formed within the device formation region of the exposed semiconductor substrate. Spacers(6) are formed at both sidewalls of the patterned conductive film for a gate and the gate oxide film. Phosphors(P) is injected into the patterned conductive film for a gate and the device formation region of the exposed semiconductor substrate by a given tilt angle toward a drain region(8) in order to form a gate electrode(4a) and source/drain regions(7,8). Arsenide(As) ions are injected into the gate electrode and the source and drain regions(7,8) to form a shallow junction on the surface of the drain region neighboring to a channel region at the bottom of the gate electrode.
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申请公布号 |
KR20010058210(A) |
申请公布日期 |
2001.07.05 |
申请号 |
KR19990061721 |
申请日期 |
1999.12.24 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, NAM YEONG;NAM, JONG WAN |
分类号 |
H01L21/336;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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