发明名称 METHOD FOR FORMING FINE PATTERN USING STENCIL MASK
摘要 PURPOSE: A method for forming fine pattern using stencil mask is provided to reduce electrical current due to scanned light by dividing transmission area formed on various mask including stencil mask into lattice of regular intervals, to reduce blur phenomenon of pattern and form a precise pattern on the wafer. CONSTITUTION: The method for forming fine pattern comprises the steps of dividing transmission area of mask through which light passes, into lattice of regular intervals and forming pattern on the wafer using the light having predetermined energy. This mask is the stencil mask used in the process of non-optical lithography or the other mask.
申请公布号 KR20010058314(A) 申请公布日期 2001.07.05
申请号 KR19990062568 申请日期 1999.12.27
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, CHEOL GYUN;YEO, GYEONG SU
分类号 G03F1/76 主分类号 G03F1/76
代理机构 代理人
主权项
地址