| 摘要 |
<p>A spectral analysis interface comprises illumination optics (2) to focus light from a narrow band source onto a sample (6); collection means for collecting incident light scattered from the sample; and input means to input the collected light to a spectral analysis device; wherein the illumination optics (2) focuses the light to a line or point focus; wherein the input means comprises refracting components (12, 13, 15); wherein the collection means comprises a primary reflector (11) and a secondary reflector (10) such that the arrangement of the primary and secondary reflectors gives rise to a central obscuration; wherein illumination of the sample is within the region obscured by the central obscuration; and wherein the collection means projects a real image of the illuminated region of the sample to the input means; wherein the input means projects a real image of the illuminated region of the sample to the spectral analysis device; and whereby substantially full chromatic aberration correction is maintained at the spectral analysis device over a range of illumination wavelengths without the need to change the relative positions of any of the components of the collection means or input means.</p> |
