Circuit and method for detecting defects in semiconductor memory

摘要

A defect detecting circuit of the present invention accelerates comparison and judgment by making an address-information renewing and holding circuit 2' previously hold outputs (program information) of a program-information holding circuit 1' at the end of the last operation as address information before renewing and holding addresses in the address-information renewing and holding circuit 2' and thereby simplifying a configuration of a compare and detection Circuit 3'.