| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspecting apparatus and an inspection method for active matrix type displays, where the inspection process for displaying defects or the like at a display region can be made to cope with display panels, having various kinds of the display region such as horizontal resolution, screen size, display capacity, etc., and the inspection process can be made highly accurate. SOLUTION: A plurality of gate lines X and a plurality of source lines Y are rendered movable by every line as a display position in the display region 41, based on display signal data for an image display. In a process of inspecting addresses, an inspector moves the actual display position in the display region 41 on the display panel onto the defects, so that an address (Xi, Yi) corresponding to the position of the display defect can be detected, as a result.
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