发明名称 |
METHOD TO PROVIDE A REDUCED CONSTANT E-FIELD DURING ERASE OF EEPROMS FOR RELIABILITY IMPROVEMENT |
摘要 |
A method to reduce the peak electric field during erase of a memory device composed of multiple memory cells. The electric field Efield of the memory cell during erase is determined by the equation Efield SIMILAR <i>a</i>g(Vgate - Vth) + Vtuv + (<i>a</i>s -1)Vsource and varying gate voltages Vgate are applied to the gate of the cell being erased so that the Vgate - Vth is constant during the erase procedure. |
申请公布号 |
WO0145113(A1) |
申请公布日期 |
2001.06.21 |
申请号 |
WO2000US33044 |
申请日期 |
2000.12.05 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
CLEVELAND, LEE |
分类号 |
G11C16/02;G11C16/14;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):G11C16/14 |
主分类号 |
G11C16/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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