发明名称 BIT LINE FORMATION METHOD
摘要 PROBLEM TO BE SOLVED: To reduce the capacitive coupling between bit lines. SOLUTION: The bit line formation method for forming the bit lines of a DRAM memory array includes a process that covers the DRAM memory array for forming an interlayer dielectric 201, a process where the interlayer dielectric 201 is etched for forming a trench 203 in the interlayer dielectric 201 and the trench 203 collectively forms bit-line patterns for tapering the side wall of the trench 203, and a process that deposits an electrically conductive substance for forming the bit lines.
申请公布号 JP2001156266(A) 申请公布日期 2001.06.08
申请号 JP19990326094 申请日期 1999.11.16
申请人 PROMOS TECHNOL INC;MOSEL VITELIC INC;SIEMENS AG 发明人 GO CHOSHAKU;CHIN SHUNI;SAI NENYU;SHO KAJUN
分类号 H01L21/302;H01L21/301;H01L21/3065;H01L21/3205;H01L21/8242;H01L23/52;H01L27/108 主分类号 H01L21/302
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