发明名称 |
BIT LINE FORMATION METHOD |
摘要 |
PROBLEM TO BE SOLVED: To reduce the capacitive coupling between bit lines. SOLUTION: The bit line formation method for forming the bit lines of a DRAM memory array includes a process that covers the DRAM memory array for forming an interlayer dielectric 201, a process where the interlayer dielectric 201 is etched for forming a trench 203 in the interlayer dielectric 201 and the trench 203 collectively forms bit-line patterns for tapering the side wall of the trench 203, and a process that deposits an electrically conductive substance for forming the bit lines. |
申请公布号 |
JP2001156266(A) |
申请公布日期 |
2001.06.08 |
申请号 |
JP19990326094 |
申请日期 |
1999.11.16 |
申请人 |
PROMOS TECHNOL INC;MOSEL VITELIC INC;SIEMENS AG |
发明人 |
GO CHOSHAKU;CHIN SHUNI;SAI NENYU;SHO KAJUN |
分类号 |
H01L21/302;H01L21/301;H01L21/3065;H01L21/3205;H01L21/8242;H01L23/52;H01L27/108 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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