Power supply system and device testing apparatus having the same

摘要

A power supply system has a judging circuit for judging occurrence of an overload condition by monitoring a power supply voltage applied to a device under test. The judging circuit detects, as reverse insertion of the device under test into a socket, occurrence of overload immediately after application of the power supply voltage to the device under test. Application of the power supply voltage to the device under test is shut down in a short time approximately equal to a rise time of the power supply voltage.