发明名称 NONVOLATILE SEMICONDUCTOR MEMORY AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a nonvolatile semiconductor memory and its manufacturing method that can suppress a band-to-band current, decrease the deterioration of a tunnel window film, reduce cells and easily increase a capacitance ratio. SOLUTION: The nonvolatile semiconductor memory composes a P-type silicon substrate 7 wherein a source 5 and a drain 4 are provided on part of its upper side, a floating gate 3 provided on the P-type silicon substrate 7 via a thermal oxide film 6, a control gate 2 provided on the floating gate 3 via the thermal oxide film 6, and a tunnel region 1 provided in a part between the floating gate 3 and the control gate 2. The distance between the control gate 2 and the floating gate 3 at the position in which the tunnel region 1 is provided is set shorter than the distance between the control gate 2 and the floating gate 3 around the tunnel region 1.
申请公布号 JP2001135736(A) 申请公布日期 2001.05.18
申请号 JP19990317514 申请日期 1999.11.08
申请人 NEC CORP 发明人 ONDA TAKAYUKI
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 H01L21/8247
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