发明名称 SUBSTRATE TREATMENT METHOD
摘要 PURPOSE: A substrate treatment method is provided to shorten a processing time and perform uniformally heating for a substrate. CONSTITUTION: When aging processing is performed, a ratio of water vapor contained in a processing gas is made comparatively large for a certain period of time from start of the processing, whereby it is accelerated for collides of TEOS to be gelled and chained in a network form, so that heating is further uniformly performed for the wafer W. Thereafter, the ratio of water vapor in the processing gas is decreased, so that a water content which is contained in the insulating film material after the aging processing can be reduced in amount.
申请公布号 KR20010039850(A) 申请公布日期 2001.05.15
申请号 KR20000050641 申请日期 2000.08.30
申请人 TOKYO ELECTRON LIMITED 发明人 SAKAI KOJI
分类号 H01L21/316;(IPC1-7):H01L21/31 主分类号 H01L21/316
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