发明名称 METHOD OF INCREASING ADHESION BETWEEN COPPER AND SILICON NITRIDE
摘要 PROBLEM TO BE SOLVED: To provide a method of increasing the adhesion between copper and silicon nitride. SOLUTION: First, a substrate coated with a dielectric layer is prepared. Then, a copper layer is formed on the dielectric layer and a copper phosphide intermediate layer is formed on the copper layer by a PECVD method and then a silicon nitride layer is formed on the copper phosphide intermediate layer. All the copper oxide layers appearing on the surface of the copper layer are turned into a copper phosphide intermediate layer. The copper phosphide intermediate layer has a lower resistance than a copper oxide and has an excellent property of effectively preventing the diffusion of copper into the dielectric layer surrounding copper.
申请公布号 JP2001127063(A) 申请公布日期 2001.05.11
申请号 JP19990302674 申请日期 1999.10.25
申请人 UNITED MICROELECTRONICS CORP 发明人 SAI SEIGEN;RYU SHIKEN;WU JUAN-YUAN
分类号 H01L21/3205;H01L21/318;H01L23/52;(IPC1-7):H01L21/320 主分类号 H01L21/3205
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