发明名称 |
METHOD OF INCREASING ADHESION BETWEEN COPPER AND SILICON NITRIDE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of increasing the adhesion between copper and silicon nitride. SOLUTION: First, a substrate coated with a dielectric layer is prepared. Then, a copper layer is formed on the dielectric layer and a copper phosphide intermediate layer is formed on the copper layer by a PECVD method and then a silicon nitride layer is formed on the copper phosphide intermediate layer. All the copper oxide layers appearing on the surface of the copper layer are turned into a copper phosphide intermediate layer. The copper phosphide intermediate layer has a lower resistance than a copper oxide and has an excellent property of effectively preventing the diffusion of copper into the dielectric layer surrounding copper.
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申请公布号 |
JP2001127063(A) |
申请公布日期 |
2001.05.11 |
申请号 |
JP19990302674 |
申请日期 |
1999.10.25 |
申请人 |
UNITED MICROELECTRONICS CORP |
发明人 |
SAI SEIGEN;RYU SHIKEN;WU JUAN-YUAN |
分类号 |
H01L21/3205;H01L21/318;H01L23/52;(IPC1-7):H01L21/320 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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