| 摘要 |
PROBLEM TO BE SOLVED: To provide an ophthalmologic apparatus capable of improving reliability of a measuring result by converting measurement in a first wave length of an infrared area into a measured value in a second wave length of an area different from the first wave length, and correcting the measurement at its conversion time. SOLUTION: A light flux of a first wave length of an infrared area emitted from a light source 11 by an illuminating optical system 10 is introduced to a retina EM of an eye E to be examined, the reflected light flux from the retina EM is introduced to a CCD 21 by a light receiving optical system 20, the reflected light flux from a front eye part of the eye E is introduced to a second CCD 33 by a second light receiving optical system 30, and after measuring retinal reflectance on the basis of the reflected light flux received to the CCD 21 by an operation part 25, the measured retinal reflectance is corrected by a correcting element preset in response to a measured result on the basis of the reflected light flux received to the second CCD 33, and after converting the corrected retinal reflectance into retinal reflectance in a second wave length of a wave length area different from the first wave length, an optical characteristic of the eye is arithmetically operated from the converted retinal reflectance, and a visible way on the eye to be examined of an object presented to the eye E on the basis of the optical characteristic of the eye arithmetically operated by the operation part 25, is displayed on a monitor 26.
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