发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a method for eliminating a sealing defect (air bubble, etc.), caused by a pressure-difference short which occurs in vacuum pressure- difference printing method. SOLUTION: A semiconductor element is mounted on a substrate comprising a wiring, and the semiconductor element is connected to the wiring part of substrate with a conductive metal. Then, the semiconductor element and connection part as well as its vicinity are sealed with a liquid resin sealing material. Here, a liquid resin sealing material containing a solvent by 5-50 wt.% is used for sealing by a vacuum pressure-difference printing method.
申请公布号 JP2001118864(A) 申请公布日期 2001.04.27
申请号 JP19990294604 申请日期 1999.10.15
申请人 HITACHI CHEM CO LTD 发明人 WAKASHIMA YOSHIAKI;FUKUTOMI NAOKI;SUZUKI KAZUHISA;YAMAZAKI AKIO;KITAKATSU TSUTOMU
分类号 H01L21/56;C08L79/08;H01L23/29;H01L23/31;(IPC1-7):H01L21/56 主分类号 H01L21/56
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