发明名称 SURFACE TEMPERATURE MEASURING METHOD AMD APPARATUS THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a surface temperature measuring method and its apparatus wherein a compact equipment structure, in which cooling in the vicinity of a measuring part is unnecessary, can be realized, flexibility is imparted to a light guide path for receiving and introducing a thermal radiation light from a material surface, and an apparatus including a detector is sufficiently isolated from the material surface to be a measuring surface and can be installed with a increased degree of freedom. SOLUTION: In the method for measuring the surface temperature of a material by detecting a thermal radiation light from the material, a light guide path for receiving a thermal radiation light from the material surface and transmitting the light to a detector, and a light receiving mechanism capable of realizing a state of high reflection and a state of low reflection to the thermal radiation light introduced through the light guide path, are installed between the detector detecting the thermal radiation light and the material surface. The thermal radiation light introduced through the light guide path is introduced to the detector through the light receiving mechanism. Thermal radiation intensities corresponding to the state of high reflection and the state of low reflection are detected. On the basis of the detected values, emissivity of the material is corrected and the surface temperature is obtained. As to the light guide path, it is preferable that the surface side of the material is constituted of heat resisting optical material and the detector side is constituted of a multi-core optical fiber.
申请公布号 JP2001091362(A) 申请公布日期 2001.04.06
申请号 JP19990268596 申请日期 1999.09.22
申请人 TOKAI CARBON CO LTD 发明人 SUGANUMA ETSURO;ONO JIRO
分类号 G01K15/00;G01J5/00;G01J5/02;G01J5/08;G01J5/62;(IPC1-7):G01J5/62 主分类号 G01K15/00
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