发明名称 DEVICE AND METHOD FOR TESTING TEST BOARD IN EXCHANGE STRUCTURE BOARD
摘要 PURPOSE: A device for testing test boards in an exchange structure board is provided to use an automatic test control board, and to simultaneously test all ports equipped in the test boards. CONSTITUTION: An automatic test control board(30) equips a control logic managing a system bus, a logic replacing a measurer and test programs, and manages all processes related to a test. The automatic test control board(30) simultaneously tests 32 ports equipped in test boards(33). The automatic test control board(30) performs test programs corresponding to the corresponding test boards(33) on the basis of device ID(Identification) values of the test boards(33), and transmits a test result to a monitor(37). In testing the test boards(33), test items of each test board(33) are different. So the automatic test control board(30) performs the test programs step by step. The test boards(33) are real test objects, and a test reference board(35) is physically connected to the automatic test control board(30) with a cable. The test reference board(35) is connected to the test boards(33) with a link under the control of the automatic test control board(30), and performs a link test of the test boards(33). The monitor(37) is connected to the automatic test control board(30) with a communication cable, and displays a test state and a test result applied from the automatic test control board(30).
申请公布号 KR20010027136(A) 申请公布日期 2001.04.06
申请号 KR19990038724 申请日期 1999.09.10
申请人 LG INFORMATION & COMMUNICATIONS LTD. 发明人 KO, GYEONG MIN
分类号 H04Q1/20;(IPC1-7):H04Q1/20 主分类号 H04Q1/20
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