发明名称 COMPOSITION FOR FORMING ANTIREFLECTION FILM AND RESIST PATTERN FORMING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a composition for forming an antireflection film having a higher dry etching rate than a photoresist. SOLUTION: The composition contains (A) at least one compound selected from a compound of the formula Si(OR1)a(OR2)b(RO3)c(OR4)d (where R1-R4 are each a 1-4C alkyl or phenyl), a compound of the formula R5Si(OR6)e(OR7)f(OR8)g (where R5 is H, a 1-4C alkyl or phenyl and R6-R8 are each a 1-3C alkyl or phenyl) and a compound of the formula R9R10Si(OR11)h(OR12)i (where R9 and R10 are each H, a 1-4C alkyl or phenyl and R11 and R12 are each a 1-3C alkyl or phenyl), and (B) at least one highly light absorbing material having a substituent capable of condensing with the component A in its structure.
申请公布号 JP2001092122(A) 申请公布日期 2001.04.06
申请号 JP19990265408 申请日期 1999.09.20
申请人 TOKYO OHKA KOGYO CO LTD 发明人 SAKAMOTO YOSHIKANE;SHIBUYA TATSUHIKO;WAKIYA KAZUMASA;IGUCHI ETSUKO;OMORI KATSUMI;YAMADA TOMOTAKA;HAGIWARA YOSHIO
分类号 H01L21/027;G03F7/004;G03F7/11 主分类号 H01L21/027
代理机构 代理人
主权项
地址