SEMICONDUCTOR INTEGRATED CIRCUIT

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit in which a test realizing a maximum delay easily and surely without having any effect on an actual circuit can be carried out. SOLUTION: A semiconductor integrated circuit 2 comprising an actual circuit 1 including a multi-stage logic circuit is provided with a test circuit 3 having circuitry identical to that of a logic circuit constituting the critical path P1 of the actual circuit 1.